Defect Analysis Equipment×日本セミラボ - メーカー・企業と製品の一覧

Crystal defect analysis device (non-contact, non-destructive)

Crystal defect analysis device (non-contact, non-destructive)

It is possible to measure without breaking the wafer.

• 企業：日本セミラボ 新横浜本社
• 価格：Other

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices